Brief description：An atomic force microscope is an analytical instrument that can be used to study the surface structure of solid materials, including insulators. It investigates the surface structure and properties of a material by detecting the extremely tiny atomic interactions between the surface of the sample and a miniature force-sensitive element. One end of a microcantilever, which is extremely sensitive to tiny forces, is fixed, while the tiny tip at the other end approaches the sample. At this point, it interacts with the sample, and the force causes the cantilever to deform or change its motion. When scanning the sample, sensors detect these changes, providing information about the force distribution, which allows you to obtain surface morphology and surface roughness information at nanometer-level resolution.

Industry Applications：材料表面形貌表征及粗糙度测量。