Brief description：An X-ray fluorescence spectrometer mainly consists of an excitation source (X-ray tube) and a detection system. The principle is: the X-ray tube produces incident X-rays (primary X-rays) to excite the sample being tested. Each element in the excited sample emits secondary X-rays (also called X-ray fluorescence), and the secondary X-rays emitted by different elements have specific energy or wavelength characteristics. The detection system measures the energy and quantity or wavelength of these emitted secondary X-rays. Then, the instrument's software converts the information collected by the detection system into the types and amounts of various elements in the sample. Additionally, the intensity of the fluorescent X-rays is related to the content of the corresponding element, allowing for quantitative analysis of the elements. Since X-ray fluorescence has a certain wavelength and also specific energy, there are two basic types of X-ray fluorescence spectrometers: wavelength-dispersive (WD-XRF) and energy-dispersive (ED-XRF).

Industry Applications：元素定性、半定量分析，离型硅含量测定，有害物质筛查。