Brief description：X-ray photoelectron spectroscopy (XPS) is an advanced analytical technique used in the microscopic analysis of electronic materials and components. It can accurately measure the binding energy of inner electrons of atoms and their chemical shifts, so it not only provides information on molecular structure and atomic valence for chemical research but also gives details on the elemental composition and content, chemical states, molecular structure, and chemical bonds of various compounds in electronic materials research. When analyzing electronic materials, XPS can provide overall chemical information as well as information about surfaces, small areas, and depth distribution. Additionally, because the X-ray beam hitting the sample surface is a photon beam, it causes very little damage to the sample, which is particularly beneficial when analyzing organic and polymer materials.
Industry Applications：Qualitative and quantitative analysis of elements, identification of compound structures.
Detailed
X-ray photoelectron spectroscopy (XPS) is an advanced analytical technique used in the microscopic analysis of electronic materials and components. It can accurately measure the binding energy of inner electrons of atoms and their chemical shifts, so it not only provides information on molecular structure and atomic valence for chemical research but also gives details on the elemental composition and content, chemical states, molecular structure, and chemical bonds of various compounds in electronic materials research. When analyzing electronic materials, XPS can provide overall chemical information as well as information about surfaces, small areas, and depth distribution. Additionally, because the X-ray beam hitting the sample surface is a photon beam, it causes very little damage to the sample, which is particularly beneficial when analyzing organic and polymer materials.
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